	<i>Test Results for Chamber M3R4-132</i></font> Test Results for Chamber M3R4-132

Bar Codes Table. M3R4-132

Bar Codes Table. M3R4-132

Chamber M3R4	Chamber Bar Code	FEBs Bar Codes	Date Dressing	Comments
132	4UAPNB03400132	4UE20900111880 4UE20900112886 4UE20900111954	26-JAN-07	Chamber is in the Pit

Gas Leak Test. M3R4-132

Gas Leak Test. M3R4-132

Limit: <= 2mb/hour

Limit: <= 2mb/hour

Chamber	Gas Leak [mb/hour]	Test Date	Comments
132	.1		Relative methode

Durk Current Test. M3R4-132

Durk Current Test. M3R4-132

Limit: Dark Current (sum of 4 gaps) <=100nA at HV=2.9 kV Gas mixture Ar(40)/CO2(55)/CF4(5) The table presents the currents (in nA) measured in the HV line.

Limit: Dark Current (sum of 4 gaps) <=100nA at HV=2.9 kV
Gas mixture Ar(40)/CO2(55)/CF4(5)
The table presents the currents (in nA) measured in the HV line.

Chamber	2.4 kV	2.5 kV	2.6 kV	2.7 kV	2.8 kV	2.9 kV	Test Date	Comments
132	0	4	5	7	8	14	27-JAN-06	T=21C, H=23%, P=963mbar

Cosmic HV-Test. M3R4-132

Cosmic HV-Test. M3R4-132

Table presents counts averaged over 24 pads measured during 300 sec in the mode AND (AB&CD).
Scan1 - HV(AB) fixed @ 2550 V
Scan2 - HV(CD) fixed @ 2550 V

Chamber	Scan	2.35 kV	2.45 kV	2.55 kV	2.65 kV	2.75 kV	2.85 kV	Date	Plot	Comments
132	1 2	289 280	323 325	338 338	362 365	452 441	871 764	04-FEB-07


Fig.1 Counts/300s averaged over 24 pads. AB&CD. Scan1: HV(AB)=2550V Scan2: HV(CD)=2550V	Fig.2 Counts distribution in 24 pads. AB&CD. HV(AB)=HV(CD)= 2550 V	Fig.3 Counts/300s averaged over 8 pads in FEB1, FEB2, FEB3. AB&CD Scan1: HV(AB)=2550V Scan2: HV(CD)=2550V

Cosmic Rays and Noise Counts from Internal Counters. M3R4-132

Cosmic Rays and Noise Counts from Internal Counters. M3R4-132

Table presents counting rates (counts per 100 sec) averaged over 24 pads in bi-gap AB or in bi-gap CD measured with Thr=16fC in all channels applying HV=2550V at one of the gaps (A,B,C,D) while the other gaps are at HV=0. Also presented are the noise rates (counts per 1 sec) averaged over 48 pads (in bi-gap AB and in bi-gap CD) measured at HV=0 in all gaps with Thr=8.5 fC and with Thr=12 fC in all channels. The thresholds were set individually for each channel according to the relation:
Thr(reg.units)= Thr(fC)*S(reg.un/fC)-OFFSet(reg.un)+Thr_Max(reg.un). Here,
Thr_Max is the threshold at Maximum of noise rate;
OFFSet=17 reg.units (corresponding to 40mV);
S=3.40 reg.units/fC is the charge sensitivity (corresponding to Sens=7.5mv/fC accepted for M3R4 chambers);

	HV(ON)				HV(OFF)
Chamber	HV(A)=2550 GapAB	HV(B)=2550 GapAB	HV(C)=2550 GapCD	HV(D)=2550 GapCD	Thr=8.5 fC	Thr=12 fC	Atm.Pres.	Date	Plots	Status
132	447	439.6	454.2	448.2	1531.9	0	Pa=975.1 mb	02-FEB-07


Fig.1 Counts distribution over pads in bi-gap AB (odd channels) and in bi-gap CD (even channels) at various HV combinations: Left_Up: HV(A)=2550V; HV(B,C,D)=0; Right_Up: HV(B)=2550V; HV(A,C,D)=0; Left_Down: HV(C)=2550V; HV(A,B,D)=0; Right_Down: HV(D)=2550V; HV(A,B,C)=0; Thr=16fC in all channels. Measurements time 100 sec.	Fig.2 Counts distribution over pads in bi-gap AB (odd channels) and bi-gap CD (even channels) at HV=0 in all gaps Thr=8.5 fC (upper plot) and in Thr=12 fC (down plot) in all channels. Measurements time 1 sec.

Thresholds Scan. M3R4-132

Thresholds Scan. M3R4-132

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
132	84	436971	12	76	453279	12	79	450066	12	02-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-132

Thr_Max in register units for M3R4-132

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	91	79	84	86	85	86	80	92	90	83	84	76	83	78	81	81
FEB-2	82	78	78	71	76	78	76	71	80	72	80	74	77	74	76	65
FEB-3	74	88	76	78	77	78	78	78	79	75	80	81	81	78	80	82

Noise rate at Thr_Max [counts/sec] for M3R4-132

Noise rate at Thr_Max [counts/sec] for M3R4-132

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	669222	427759	489573	332708	314310	380999	322261	306973	501895	398646	462612	480114	426170	341711	622393	514187
FEB-2	461794	478353	305449	323180	340234	603770	359327	301250	401249	453722	673938	315943	486941	727151	542779	477383
FEB-3	336753	662851	341490	405243	299487	534945	259374	544743	443445	485064	290714	585391	243989	662430	593207	511922