<i>Test Results for Chamber M3R4-5</i></font>

Test Results for Chamber M3R4-5


<font color="#00008B" size="5"><i><b>Bar Codes Table. M3R4-5</b></i></font>

Bar Codes Table. M3R4-5

Chamber
M3R4
Chamber
Bar Code
FEBs
Bar Codes
Date Dressing Comments
5 4UAPNB03400005 4UE20900113011
4UE20900113163
4UE20900112818
18-JAN-07 Chamber is in the Pit


<font color="DarkBlue" size="5"><i><b>Gas Leak Test. M3R4-5</b></i></font>

Gas Leak Test. M3R4-5

<font color="DarkRed" size="4"><i>Limit: <= 2mb/hour</i></font>

Limit: <= 2mb/hour

Chamber Gas Leak
[mb/hour]
Test Date Comments
5 .1 Relative methode


<font color="DarkBlue" size="5"><i><b>Durk Current Test. M3R4-5</b></i></font>

Durk Current Test. M3R4-5

<font color="DarkRed" size="4"><i>Limit: Dark Current (sum of 4 gaps) <=100nA at HV=2.9 kV<br />Gas mixture Ar(40)/CO2(55)/CF4(5)<br />The table presents the currents (in nA) measured in the HV line.</i></font>

Limit: Dark Current (sum of 4 gaps) <=100nA at HV=2.9 kV
Gas mixture Ar(40)/CO2(55)/CF4(5)
The table presents the currents (in nA) measured in the HV line.

Chamber 2.4 kV 2.5 kV 2.6 kV 2.7 kV 2.8 kV 2.9 kV Test Date Comments
5 2 2 2 6 8 14 13-OCT-05 chamber is OK



<font color="#00008B" size="5"><i><b>Cosmic HV-Test. M3R4-5</b></i></font>

Cosmic HV-Test. M3R4-5

Table presents counts averaged over 24 pads measured during 300 sec in the mode AND (AB&CD).
Scan1 - HV(AB) fixed @ 2550 V
Scan2 - HV(CD) fixed @ 2550 V


Chamber Scan 2.35 kV 2.45 kV 2.55 kV 2.65 kV 2.75 kV 2.85 kV Date Plot Comments
5 1
2
313
312
351
339
376
376
448
444
617
664
1144
1108
23-JAN-07


Fig.1 Counts/300s averaged over 24 pads.
AB&CD.
Scan1: HV(AB)=2550V
Scan2: HV(CD)=2550V
Fig.2 Counts distribution in 24 pads.
AB&CD.
HV(AB)=HV(CD)= 2550 V
Fig.3 Counts/300s averaged over 8 pads
in FEB1, FEB2, FEB3.
AB&CD
Scan1: HV(AB)=2550V
Scan2: HV(CD)=2550V


<font color="DarkRed" size="6"><i><b>Cosmic Rays and Noise Counts from Internal Counters. M3R4-5</b></i></font>

Cosmic Rays and Noise Counts from Internal Counters. M3R4-5

Table presents counting rates (counts per 100 sec) averaged over 24 pads in bi-gap AB or in bi-gap CD measured with Thr=16fC in all channels applying HV=2550V at one of the gaps (A,B,C,D) while the other gaps are at HV=0. Also presented are the noise rates (counts per 1 sec) averaged over 48 pads (in bi-gap AB and in bi-gap CD) measured at HV=0 in all gaps with Thr=12fC and with Thr=12fC in all channels. The thresholds were set individually for each channel according to the relation:
Thr(reg.units)= Thr(fC)*S(reg.un/fC)-OFFSet(reg.un)+Thr_Max(reg.un). Here,
Thr_Max is the threshold at Maximum of noise rate;
OFFSet=17 reg.units (corresponding to 40mV);
S=3.40 reg.units/fC is the charge sensitivity (corresponding to Sens=7.5mv/fC accepted for M3R4 chambers);


HV(ON) HV(OFF)
Chamber HV(A)=2550
GapAB
HV(B)=2550
GapAB
HV(C)=2550
GapCD
HV(D)=2550
GapCD
Thr=12fC Thr=12fC Atm.Pres. Date Plots Status
5 493 520.1 475.2 490.9 .6 .8 Pa=969.7 mb 23-JAN-07

Fig.1 Counts distribution over pads in bi-gap AB (odd channels) and in bi-gap CD (even channels) at various HV combinations:
Left_Up: HV(A)=2550V; HV(B,C,D)=0;
Right_Up: HV(B)=2550V; HV(A,C,D)=0;
Left_Down: HV(C)=2550V; HV(A,B,D)=0;
Right_Down: HV(D)=2550V; HV(A,B,C)=0;
Thr=16fC in all channels. Measurements time 100 sec.
Fig.2 Counts distribution over pads in bi-gap AB (odd channels) and bi-gap CD (even channels) at HV=0 in all gaps
Thr=12fC (upper plot) and in Thr=12fC (down plot) in all channels. Measurements time 1 sec.

<font color="DarkRed" size="6"><i><b>Thresholds Scan. M3R4-5</b></i></font>

Thresholds Scan. M3R4-5

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

FEB-1. Mean values. FEB-2. Mean values. FEB-3. Mean values.
Chamber Thr_Max
[r.u.]
N_Max
[counts/s]
D_100
[r.u.]
Thr_Max
[r.u.]
N_Max
[counts/s]
D_100
[r.u.]
Thr_Max
[r.u.]
N_Max
[counts/s]
D_100
[r.u.]
Test Date Plots Comments
5 80 436804 13 73 450116 13 77 446673 13 23-JAN-07 Sens=7.5mV/fc Th=15fc
<font color="DarkRed" size="5"><i><b>Thr_Max in register units for M3R4-5</b></i><br /></font>

Thr_Max in register units for M3R4-5

FEB
Channels
Ch_1 Ch_2 Ch_3 Ch_4 Ch_5 Ch_6 Ch_7 Ch_8 Ch_9 Ch_10 Ch_11 Ch_12 Ch_13 Ch_14 Ch_15 Ch_16
FEB-1 74 85 77 83 78 88 76 80 72 82 75 75 82 83 85 78
FEB-2 73 68 78 73 70 71 71 71 71 75 76 80 79 71 71 75
FEB-3 80 71 76 84 79 76 74 74 75 79 69 77 74 83 80 77
<font color="DarkRed" size="5"><i><b>Noise rate at Thr_Max [counts/sec] for M3R4-5</b></i><br /></font>

Noise rate at Thr_Max [counts/sec] for M3R4-5

FEB
Channels
Ch_1 Ch_2 Ch_3 Ch_4 Ch_5 Ch_6 Ch_7 Ch_8 Ch_9 Ch_10 Ch_11 Ch_12 Ch_13 Ch_14 Ch_15 Ch_16
FEB-1 500954 564264 454862 422572 362132 501242 380871 429142 368112 516157 323218 503759 342291 432264 433490 453527
FEB-2 444033 700058 426062 597273 243391 453674 585997 605594 349176 351723 339078 371330 414890 383833 483062 452681
FEB-3 418328 486005 488863 263243 469934 357856 416029 265796 470250 244907 513246 396804 840904 365631 662289 486675
<font color="DarkRed" size="5"><i><b><FONT FACE="Symbol">D_100 </FONT> - in register units for M3R4-5</b></i><br /></font>

D_100 - in register units for M3R4-5

FEB
Channels
Ch_1 Ch_2 Ch_3 Ch_4 Ch_5 Ch_6 Ch_7 Ch_8 Ch_9 Ch_10 Ch_11 Ch_12 Ch_13 Ch_14 Ch_15 Ch_16
FEB-1 12 14 12 12 13 11 11 12 12 13 13 13 13 13 13 13
FEB-2 12 14 14 14 12 12 13 13 13 12 13 10 14 12 14 12
FEB-3 12 13 12 11 14 11 12 11 12 11 14 13 14 12 15 13
<font color="DarkRed" size="5"><i><b>Noise counts vs Thresholds. M3R4-5</b></i></font>

Noise counts vs Thresholds. M3R4-5


Noise rates vs Thresholds for FEB-1 Noise rates vs Thresholds for FEB-2 Noise rates vs Thresholds for FEB-3
<font color="DarkRed" size="5"><i><b>PLOTS of Thresholds Scan Results. M3R4-5</b></i></font>

PLOTS of Thresholds Scan Results. M3R4-5

Scan results for FEB-1 (left plots), for FEB-2 (middle plots), for FEB-3 (right plots).
Thr_Max vs channel number (upper plot)
N_Max vs channel number (middle plot)
D_100 vs channel number (lower plot)



For comments, contact: Petr.Neustroev@cern.ch