	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
107	73	517393	12	76	363083	11	73	395379	11	18-DEC-06		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-107

Thr_Max in register units for M3R4-107

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	72	73	86	73	73	69	69	69	75	73	74	69	80	70	76	73
FEB-2	71	83	68	82	70	82	73	84	76	77	75	73	73	75	80	76
FEB-3	70	75	75	68	74	80	79	58	75	71	73	66	78	76	78	73

Noise rate at Thr_Max [counts/sec] for M3R4-107

Noise rate at Thr_Max [counts/sec] for M3R4-107

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	759802	415663	389423	424543	470938	245865	697545	217519	468335	212580	465372	474004	523836	247439	1182610	1082811
FEB-2	345458	407022	296790	301006	198868	383167	264991	268339	323699	508991	370146	507641	461820	478311	459483	233594
FEB-3	482530	326167	348518	607830	334067	399148	485365	229859	307211	316623	548210	164661	589378	289575	581062	315867