	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
108	82	416722	13	80	443571	12	77	455930	12	29-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-108

Thr_Max in register units for M3R4-108

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	79	85	72	83	84	88	76	85	79	89	81	89	78	82	76	87
FEB-2	76	84	83	78	81	78	83	74	79	79	73	80	79	79	87	80
FEB-3	76	81	76	81	84	80	78	85	71	80	71	77	69	83	67	77

Noise rate at Thr_Max [counts/sec] for M3R4-108

Noise rate at Thr_Max [counts/sec] for M3R4-108

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	439433	533810	423095	385551	488189	242868	505493	236862	417304	340403	373467	332135	451061	369735	654642	473496
FEB-2	669553	340300	609878	275966	421424	604550	389056	268692	458680	272998	484598	253038	443038	404898	757032	443427
FEB-3	393776	555091	449774	333868	390189	354934	312418	256767	602555	583888	712402	316839	423590	389099	744609	475076