	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
110	76	410804	15	79	370233	12	82	440716	12	29-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-110

Thr_Max in register units for M3R4-110

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	67	76	75	77	70	74	82	79	79	72	82	81	78	70	86	73
FEB-2	75	81	82	85	74	81	80	81	82	79	75	76	74	83	79	82
FEB-3	75	82	81	86	72	85	80	88	79	83	81	81	84	93	76	82

Noise rate at Thr_Max [counts/sec] for M3R4-110

Noise rate at Thr_Max [counts/sec] for M3R4-110

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	306651	580415	197700	478657	200659	554241	424683	455774	253417	428146	320069	493877	369820	475423	420369	612956
FEB-2	368512	505345	366864	398036	251720	356162	358060	448614	284080	268574	402430	321468	371082	342504	502002	378274
FEB-3	429048	598795	270700	577717	434601	371569	263033	610193	280977	447741	380179	369583	302408	459785	568020	687103