	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
112	81	398301	11	75	277258	10	79	457313	11	16-DEC-06		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-112

Thr_Max in register units for M3R4-112

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	81	75	82	83	82	80	79	78	80	78	76	88	81	86	77	83
FEB-2	71	81	74	74	74	78	74	70	69	86	64	84	62	84	69	85
FEB-3	86	85	83	80	76	79	89	78	73	82	78	79	74	81	75	69

Noise rate at Thr_Max [counts/sec] for M3R4-112

Noise rate at Thr_Max [counts/sec] for M3R4-112

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	660145	492381	434524	478547	555140	235576	336294	269911	274303	257584	481535	430488	408795	302769	424179	330641
FEB-2	254691	369062	224057	410808	135224	227612	242390	309283	211825	292240	202258	198708	410736	308680	312955	325591
FEB-3	409124	598413	268881	616767	419477	731323	322505	355046	267706	349749	315229	301601	332499	456992	768198	803501