	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
114	81	402838	13	78	309905	11	72	370076	11	29-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-114

Thr_Max in register units for M3R4-114

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	76	87	85	83	78	83	82	78	79	77	81	77	92	75	82	75
FEB-2	75	82	80	74	82	77	84	81	77	81	75	77	80	77	82	70
FEB-3	71	69	70	78	69	73	74	75	71	71	67	70	71	77	72	66

Noise rate at Thr_Max [counts/sec] for M3R4-114

Noise rate at Thr_Max [counts/sec] for M3R4-114

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	441610	603993	528535	378057	306990	391881	298964	329785	365693	404176	376703	373082	321621	399980	502533	421801
FEB-2	309399	500350	305146	311817	342783	326107	192432	236491	263628	337836	236193	305319	275382	380526	326477	308597
FEB-3	371827	607769	343278	315165	383164	312656	301285	302580	404823	474409	365781	289293	338160	345545	474305	291176