	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
115	78	425763	11	78	442603	11	85	376127	10	30-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-115

Thr_Max in register units for M3R4-115

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	75	77	78	76	83	86	70	79	72	84	76	76	76	76	74	83
FEB-2	67	76	74	78	75	90	72	88	84	83	72	81	76	75	80	79
FEB-3	87	77	92	84	89	85	88	85	85	85	87	83	90	77	81	85

Noise rate at Thr_Max [counts/sec] for M3R4-115

Noise rate at Thr_Max [counts/sec] for M3R4-115

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	437345	453791	537782	593755	361151	497147	324336	257467	319957	308284	316586	239524	532469	401897	745229	485483
FEB-2	333606	447312	340413	567533	498164	257247	255722	295920	458954	453456	723014	288337	290691	470537	664122	736617
FEB-3	654615	215340	414707	219219	489961	131733	422584	174387	414334	142454	554659	171035	522024	239613	999710	251654