	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
119	75	417027	16	82	524025	13	80	625588	13	30-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-119

Thr_Max in register units for M3R4-119

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	70	71	79	76	79	71	73	75	73	76	79	79	78	71	80	75
FEB-2	86	81	80	84	85	80	89	82	85	83	81	85	85	71	76	86
FEB-3	80	82	78	79	77	82	74	80	79	88	80	87	76	82	74	83

Noise rate at Thr_Max [counts/sec] for M3R4-119

Noise rate at Thr_Max [counts/sec] for M3R4-119

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	401241	431226	377577	742889	420690	291184	403424	360149	328009	240816	343761	298601	409606	412754	505707	704803
FEB-2	480928	523353	406129	434014	690062	424334	550316	565229	426835	438801	462060	568177	467903	528094	689863	728302
FEB-3	675536	758779	592685	366812	703246	657880	611577	428086	597553	628027	524669	438745	698962	495101	1079099	752652