	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
120	79	475755	14	77	492093	13	76	377081	12	31-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-120

Thr_Max in register units for M3R4-120

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	81	75	74	76	80	73	79	80	81	73	90	77	89	82	81	79
FEB-2	84	87	75	83	68	79	76	79	64	77	76	77	78	87	71	70
FEB-3	81	84	76	80	71	86	69	74	69	73	73	79	72	78	68	79

Noise rate at Thr_Max [counts/sec] for M3R4-120

Noise rate at Thr_Max [counts/sec] for M3R4-120

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	615002	668497	368936	673702	468091	422744	334332	387250	397472	461684	377671	452346	383130	388345	538427	674451
FEB-2	492564	612436	472797	391743	575260	410740	596348	617581	361516	419567	504308	317164	459661	424299	621326	596182
FEB-3	363333	486687	221565	527960	218233	536097	266893	224926	284270	321403	407229	395000	371966	459644	497733	450353