	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
122	78	419000	13	79	496470	13	73	458700	13	31-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-122

Thr_Max in register units for M3R4-122

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	75	79	82	83	66	85	79	83	66	81	81	79	73	83	75	73
FEB-2	72	84	81	89	81	83	75	81	81	74	73	88	76	74	69	81
FEB-3	71	84	73	82	74	83	62	75	64	75	61	74	62	84	70	73

Noise rate at Thr_Max [counts/sec] for M3R4-122

Noise rate at Thr_Max [counts/sec] for M3R4-122

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	506241	548566	628550	394923	426941	358626	509026	408537	404875	329676	271786	350471	297698	394390	499490	374196
FEB-2	509204	565786	481969	476487	404544	434285	497100	371810	493225	364612	726437	333634	553855	437610	708080	584889
FEB-3	413001	582955	426315	453595	465654	480028	323248	381702	423555	411544	473151	463011	507902	507165	549671	476698