	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
123	81	525561	14	82	519699	13	76	457858	12	31-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-123

Thr_Max in register units for M3R4-123

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	80	81	85	85	75	82	84	76	89	83	79	85	83	76	81	75
FEB-2	91	82	89	73	95	74	80	74	90	79	86	73	88	80	78	73
FEB-3	71	81	71	79	75	75	71	82	76	73	74	77	69	82	78	79

Noise rate at Thr_Max [counts/sec] for M3R4-123

Noise rate at Thr_Max [counts/sec] for M3R4-123

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	703021	603595	507582	537955	510717	411892	425732	368302	445636	540683	457266	437578	635133	705854	608415	509613
FEB-2	480115	508278	559679	495524	582822	746550	552713	682920	331985	564094	405794	440085	460678	457148	567982	478818
FEB-3	324622	616567	333465	415323	293182	461004	290500	456730	291443	474280	376619	770817	352477	662956	595835	609912