	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
126	78	483339	13	79	478331	12	77	512006	12	01-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-126

Thr_Max in register units for M3R4-126

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	67	82	77	80	65	76	74	83	81	83	82	81	76	85	78	79
FEB-2	91	65	88	67	83	68	94	68	85	72	83	72	87	77	79	79
FEB-3	75	78	74	80	72	89	75	84	69	80	67	86	70	86	64	84

Noise rate at Thr_Max [counts/sec] for M3R4-126

Noise rate at Thr_Max [counts/sec] for M3R4-126

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	326309	866321	461289	498777	328904	372893	350069	445945	365605	420309	516987	657612	328424	530700	713614	549671
FEB-2	465994	557657	432084	454706	434179	341753	478815	351896	469959	314083	532583	313513	720832	382612	772759	629864
FEB-3	303873	707817	319298	1014955	350555	378134	310061	458950	402093	650282	378012	480235	461984	806916	586390	582544