	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
129	79	427069	14	82	586482	13	79	507585	12	01-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-129

Thr_Max in register units for M3R4-129

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	85	84	86	78	78	80	84	74	78	76	82	75	77	73	82	70
FEB-2	77	86	82	86	76	81	77	81	81	91	82	83	83	84	82	84
FEB-3	76	85	83	86	72	76	84	82	76	79	75	74	77	81	82	78

Noise rate at Thr_Max [counts/sec] for M3R4-129

Noise rate at Thr_Max [counts/sec] for M3R4-129

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	587169	356634	572626	249848	377464	222771	478251	246533	691276	235007	449770	206144	533516	276179	951197	398724
FEB-2	528991	681228	617579	598541	519932	585884	473074	547892	461921	558649	551348	382232	554729	583347	1133331	605032
FEB-3	447859	540725	485577	383842	346081	323825	544179	263115	470689	313613	608460	1048428	573501	589096	645279	537092