	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
130	81	566273	14	78	638220	13	80	527827	13	02-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-130

Thr_Max in register units for M3R4-130

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	75	83	83	77	87	80	81	89	84	86	74	79	80	76	82	79
FEB-2	77	78	76	76	66	79	79	81	77	74	79	70	78	90	84	78
FEB-3	78	85	77	88	79	81	69	86	77	80	76	76	74	84	82	81

Noise rate at Thr_Max [counts/sec] for M3R4-130

Noise rate at Thr_Max [counts/sec] for M3R4-130

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	526017	603939	370189	661151	388016	541798	744762	459958	543708	608916	531639	459851	493548	495690	712418	918770
FEB-2	547992	676183	480829	583019	491153	491205	473878	491065	649130	736787	674622	660562	607141	985398	595491	1067061
FEB-3	439816	750397	690342	642229	377556	386706	445494	420896	397789	376767	517209	523820	538230	608424	834130	495425