	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
132	84	436971	12	76	453279	12	79	450066	12	02-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-132

Thr_Max in register units for M3R4-132

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	91	79	84	86	85	86	80	92	90	83	84	76	83	78	81	81
FEB-2	82	78	78	71	76	78	76	71	80	72	80	74	77	74	76	65
FEB-3	74	88	76	78	77	78	78	78	79	75	80	81	81	78	80	82

Noise rate at Thr_Max [counts/sec] for M3R4-132

Noise rate at Thr_Max [counts/sec] for M3R4-132

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	669222	427759	489573	332708	314310	380999	322261	306973	501895	398646	462612	480114	426170	341711	622393	514187
FEB-2	461794	478353	305449	323180	340234	603770	359327	301250	401249	453722	673938	315943	486941	727151	542779	477383
FEB-3	336753	662851	341490	405243	299487	534945	259374	544743	443445	485064	290714	585391	243989	662430	593207	511922