	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
133	82	497483	13	81	337451	11	72	484156	12	02-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-133

Thr_Max in register units for M3R4-133

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	89	76	85	75	91	64	89	82	81	78	90	80	92	81	85	75
FEB-2	76	87	86	82	88	82	90	76	85	78	77	79	83	78	77	72
FEB-3	75	83	70	76	69	75	77	71	69	70	67	71	72	76	69	68

Noise rate at Thr_Max [counts/sec] for M3R4-133

Noise rate at Thr_Max [counts/sec] for M3R4-133

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	566822	563778	361326	484194	389274	534375	439137	403736	673584	368067	401566	283238	520709	410337	951039	608547
FEB-2	363834	446671	308385	312732	339267	252015	272041	313692	421734	247386	331077	196563	404893	278637	530746	379537
FEB-3	512924	662913	274202	366914	228301	415432	301911	728539	461978	494438	245230	439384	518800	569975	632402	893160