	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
134	80	451832	15	79	411265	12	76	530460	12	02-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-134

Thr_Max in register units for M3R4-134

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	74	86	76	87	71	79	83	82	82	81	75	82	71	82	78	84
FEB-2	71	78	79	80	74	77	79	81	76	84	84	82	72	83	80	86
FEB-3	86	78	75	81	75	79	67	78	76	82	68	74	73	83	72	76

Noise rate at Thr_Max [counts/sec] for M3R4-134

Noise rate at Thr_Max [counts/sec] for M3R4-134

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	510882	535736	457097	305978	507606	410877	399870	382891	376392	275841	508825	389556	428923	448149	784501	506187
FEB-2	459314	621392	437255	614474	323533	394124	299711	269219	310147	320535	366702	375129	361041	415014	576959	435685
FEB-3	714880	510692	369039	571455	437161	501968	466750	419863	680445	389208	490423	786695	491272	400505	694456	562552