	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
135	78	565327	14	82	469680	12	81	622993	13	06-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-135

Thr_Max in register units for M3R4-135

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	71	78	74	82	73	79	78	81	81	82	77	82	81	78	74	80
FEB-2	81	86	80	80	85	79	90	75	82	72	83	83	86	79	81	82
FEB-3	69	91	80	87	76	84	73	81	75	79	82	92	72	86	79	86

Noise rate at Thr_Max [counts/sec] for M3R4-135

Noise rate at Thr_Max [counts/sec] for M3R4-135

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	491139	550231	538340	640174	529671	469462	529439	487571	479731	471731	661263	512641	693289	594148	745019	651390
FEB-2	508952	464995	501783	388926	370975	499845	268540	409639	457415	413959	362931	353567	449702	615962	580973	866719
FEB-3	586598	523350	785127	426836	437012	518202	410697	419013	1122757	927163	693756	668832	516814	501238	750946	679539