	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
138	74	482006	13	76	397872	12	72	377106	11	05-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-138

Thr_Max in register units for M3R4-138

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	74	75	83	80	76	74	70	73	71	69	63	78	74	75	76	77
FEB-2	84	87	75	79	77	74	72	80	67	75	69	78	72	69	73	80
FEB-3	74	76	72	74	76	76	77	73	70	71	73	65	66	71	71	72

Noise rate at Thr_Max [counts/sec] for M3R4-138

Noise rate at Thr_Max [counts/sec] for M3R4-138

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	417723	666116	248125	394791	402214	375680	370665	325783	364548	465738	351621	349689	380152	451010	1218848	929399
FEB-2	475968	483593	369043	294945	347029	352535	252711	452978	375662	304535	340306	355491	417645	477412	678111	387992
FEB-3	428467	463848	389591	593529	213543	324439	231560	382842	444678	244112	270914	298283	440526	367914	542482	396970