	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
139	79	621219	14	82	426192	11	78	541487	14	05-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-139

Thr_Max in register units for M3R4-139

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	74	89	78	75	83	71	83	77	80	76	78	79	81	76	88	79
FEB-2	81	89	76	80	75	86	83	89	88	82	73	83	83	77	80	86
FEB-3	84	79	82	71	76	68	72	68	83	72	80	85	88	74	83	80

Noise rate at Thr_Max [counts/sec] for M3R4-139

Noise rate at Thr_Max [counts/sec] for M3R4-139

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	530996	829449	590103	504772	648926	455638	421771	613299	448651	600154	797225	770653	610132	653469	760507	703762
FEB-2	447702	657900	571735	375590	222695	454748	457840	369124	245947	329028	545782	281746	430770	475035	559104	394324
FEB-3	519356	614262	488118	445382	373025	605717	609222	397824	587001	435692	554357	499093	598902	534918	701450	699480