	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
140	78	477276	14	76	446074	12	76	483096	12	06-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-140

Thr_Max in register units for M3R4-140

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	77	78	80	80	79	79	79	78	81	80	76	77	85	79	78	67
FEB-2	72	79	75	80	72	80	75	79	73	81	76	75	72	72	82	71
FEB-3	77	77	82	76	76	86	75	79	72	78	72	71	71	73	77	75

Noise rate at Thr_Max [counts/sec] for M3R4-140

Noise rate at Thr_Max [counts/sec] for M3R4-140

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	415135	628637	453866	487435	398059	450757	382390	462623	447300	470315	770307	347914	410723	483188	569245	458528
FEB-2	543439	416227	509207	395556	741390	308004	487405	255649	456588	238744	483759	253367	548566	373700	613222	512364
FEB-3	347664	545938	410770	561236	316385	336258	520076	607035	344392	278409	474633	720946	480550	427278	675499	682472