	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
141	79	491967	14	81	469556	12	75	476707	12	06-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-141

Thr_Max in register units for M3R4-141

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	75	87	75	77	79	81	79	82	72	82	69	75	86	84	80	77
FEB-2	83	77	83	80	79	76	85	77	84	77	81	81	80	81	85	85
FEB-3	80	76	85	83	67	76	76	74	70	75	71	78	65	74	69	73

Noise rate at Thr_Max [counts/sec] for M3R4-141

Noise rate at Thr_Max [counts/sec] for M3R4-141

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	416906	542101	342942	537724	310259	612646	291553	457422	249385	651168	358309	473853	527379	784619	715826	599373
FEB-2	392969	655407	353132	366005	316303	380454	404485	431692	456124	355684	571931	904115	383548	506677	497915	536458
FEB-3	521942	428939	594858	336482	377098	557758	522530	385242	408842	538605	575659	349989	406236	519534	645198	458397