	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
142	76	456526	14	77	451097	12	75	522039	13	06-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-142

Thr_Max in register units for M3R4-142

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	74	72	75	68	83	74	76	73	79	82	74	77	82	72	80	68
FEB-2	83	79	73	72	73	67	83	73	81	74	79	82	77	77	81	75
FEB-3	81	78	83	80	68	79	76	85	67	71	69	75	65	72	72	85

Noise rate at Thr_Max [counts/sec] for M3R4-142

Noise rate at Thr_Max [counts/sec] for M3R4-142

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	525504	549827	597255	353099	402410	383031	497222	424640	516022	294585	448825	446264	430202	461726	594003	379794
FEB-2	403847	528423	325847	293704	331852	371283	359825	339337	291888	708525	458018	382713	455931	486979	803636	675738
FEB-3	527826	684496	332733	564268	422697	612321	299548	369021	351918	468217	369255	583504	622797	649225	686741	808052