	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
144	81	540550	13	81	339473	11	79	481501	13	24-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-144

Thr_Max in register units for M3R4-144

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	89	76	82	88	87	75	78	81	76	76	85	83	83	77	85	81
FEB-2	79	87	75	90	78	85	75	87	79	81	77	78	86	84	77	81
FEB-3	75	82	77	83	73	77	72	76	82	86	81	78	83	78	84	83

Noise rate at Thr_Max [counts/sec] for M3R4-144

Noise rate at Thr_Max [counts/sec] for M3R4-144

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	581578	501067	540112	405061	633743	337918	664192	396986	567685	380759	677696	380896	852255	481580	683757	563519
FEB-2	351297	365105	323233	222671	302592	184227	625360	193980	384548	252408	421747	166965	688933	246100	503680	198726
FEB-3	464541	579174	482208	540036	417725	402504	389410	375460	373612	595032	484625	423219	465401	561046	450289	699738