	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
148	76	501441	14	69	486596	13	81	474646	13	24-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-148

Thr_Max in register units for M3R4-148

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	77	77	73	67	77	68	81	76	72	73	82	70	84	78	86	82
FEB-2	76	66	80	66	70	66	65	65	69	65	62	67	67	69	72	77
FEB-3	81	80	84	84	82	88	75	83	70	84	73	79	75	78	90	87

Noise rate at Thr_Max [counts/sec] for M3R4-148

Noise rate at Thr_Max [counts/sec] for M3R4-148

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	607120	877435	370255	534657	549175	396899	542618	443350	405771	427399	449573	432885	385109	477997	584660	538158
FEB-2	456870	465650	618380	612523	347793	298736	447492	376739	390872	387928	466321	400396	547776	520760	792012	655292
FEB-3	450966	822762	431227	415934	515017	396493	548389	307285	324522	326313	408204	442090	482015	469103	585015	669003