	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
149	77	516099	14	84	508818	13	75	461580	13	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-149

Thr_Max in register units for M3R4-149

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	72	74	76	80	81	74	75	77	83	72	80	84	77	79	73	79
FEB-2	82	90	90	83	88	72	90	83	87	88	87	81	85	78	84	78
FEB-3	72	68	79	72	78	64	83	66	77	70	85	73	78	78	82	79

Noise rate at Thr_Max [counts/sec] for M3R4-149

Noise rate at Thr_Max [counts/sec] for M3R4-149

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	467761	782874	557055	469653	320542	514954	429147	622391	571798	343616	374167	698346	515347	426092	631867	531967
FEB-2	592452	570881	490655	718825	679175	443409	436429	451345	413370	456707	455696	399726	503437	433236	582102	513650
FEB-3	385188	521597	453445	690934	369732	390004	452531	463330	417576	440464	334494	373638	372634	566034	524220	629459