	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
150	80	466255	13	75	445099	12	73	489587	12	26-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-150

Thr_Max in register units for M3R4-150

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	82	81	76	79	81	80	79	79	78	83	89	75	85	83	72	75
FEB-2	81	70	78	73	79	69	79	65	73	70	69	81	75	79	83	72
FEB-3	70	67	77	69	75	71	75	76	73	75	70	74	69	86	61	77

Noise rate at Thr_Max [counts/sec] for M3R4-150

Noise rate at Thr_Max [counts/sec] for M3R4-150

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	401502	502885	449000	378299	596172	339427	535379	626570	403561	516804	352168	447123	712010	366998	389626	442553
FEB-2	411423	538606	374465	401856	320386	726547	512455	282992	403555	453066	425788	303016	493627	365671	614426	493712
FEB-3	370012	676840	444402	478255	347194	466062	418396	428790	345747	370837	559626	560869	453148	687083	525436	700698