	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
151	77	360375	12	81	469973	12	79	439900	12	26-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-151

Thr_Max in register units for M3R4-151

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	81	76	76	80	76	80	76	75	77	73	68	81	78	80	74	83
FEB-2	85	86	80	87	79	86	80	79	82	77	78	79	82	79	84	73
FEB-3	81	77	77	78	82	75	84	75	85	79	84	75	79	77	76	78

Noise rate at Thr_Max [counts/sec] for M3R4-151

Noise rate at Thr_Max [counts/sec] for M3R4-151

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	371880	479059	307392	432996	232011	335756	305365	320153	300238	233452	318814	313504	427950	407108	471437	508887
FEB-2	539628	451832	477035	510312	294947	334372	480558	303046	487188	277191	478098	302818	511997	395620	1248079	426850
FEB-3	394702	569667	432983	489578	306072	568173	248141	409727	354532	672093	342809	488527	290220	464456	531182	475539