	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
152	85	404545	12	78	465067	13	76	413245	13	26-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-152

Thr_Max in register units for M3R4-152

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	87	82	84	88	84	86	86	87	77	83	83	89	81	87	90	78
FEB-2	80	91	75	83	74	77	67	80	79	80	71	81	68	82	82	81
FEB-3	70	75	78	77	76	85	79	70	74	77	72	81	68	79	79	71

Noise rate at Thr_Max [counts/sec] for M3R4-152

Noise rate at Thr_Max [counts/sec] for M3R4-152

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	359411	436667	466801	536652	278015	364257	369338	489231	324648	436023	353993	295829	396140	366404	490024	509291
FEB-2	570107	488875	414386	374288	300928	635358	346044	408921	385419	463842	761876	324865	403865	446753	669948	445600
FEB-3	495363	564993	461213	360559	316674	266813	310436	249275	449533	336894	364140	330652	425875	415134	617771	646601