	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
154	75	331566	11	76	404111	12	78	380790	11	26-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-154

Thr_Max in register units for M3R4-154

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	76	79	76	68	75	77	79	73	73	70	82	69	80	63	79	73
FEB-2	82	78	78	67	78	68	80	75	83	74	74	71	77	78	78	82
FEB-3	82	79	80	77	79	78	77	84	78	77	79	68	74	78	80	80

Noise rate at Thr_Max [counts/sec] for M3R4-154

Noise rate at Thr_Max [counts/sec] for M3R4-154

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	341179	642809	207059	295030	194972	253267	378367	374642	403299	291317	282439	257346	212526	446789	379908	344102
FEB-2	442714	366181	422441	368966	305841	370100	461353	398016	430174	320692	439979	325976	390987	401202	594765	426381
FEB-3	381603	563533	350130	432578	233317	511725	236084	370834	204789	384359	335086	371715	300762	538754	447990	429373