	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
155	76	437546	12	74	372096	11	78	480715	14	29-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-155

Thr_Max in register units for M3R4-155

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	77	80	83	73	79	78	80	76	76	68	78	75	84	64	79	71
FEB-2	69	75	67	68	79	75	79	71	76	69	78	80	67	75	81	72
FEB-3	78	67	86	71	81	77	81	72	77	74	76	85	84	76	83	78

Noise rate at Thr_Max [counts/sec] for M3R4-155

Noise rate at Thr_Max [counts/sec] for M3R4-155

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	570479	550753	369546	313841	380432	559523	453132	276587	382326	294414	551121	436338	420315	430845	617166	393919
FEB-2	280646	655989	283319	607179	324757	306032	210615	333716	287137	347644	327495	324818	311654	460379	364318	527844
FEB-3	577185	516692	573956	593600	476493	313278	516441	355040	425959	381290	594922	460506	394486	449952	593171	468471