	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
156	80	614043	15	75	439940	12	81	455471	13	05-JUN-07

Thr_Max in register units for M3R4-156

Thr_Max in register units for M3R4-156

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	84	81	73	81	84	86	80	81	87	78	87	75	72	77	80	78
FEB-2	79	78	71	74	78	73	75	67	80	75	76	74	80	71	74	81
FEB-3	80	76	80	75	77	81	79	86	84	81	89	75	75	82	85	84

Noise rate at Thr_Max [counts/sec] for M3R4-156

Noise rate at Thr_Max [counts/sec] for M3R4-156

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	735912	753768	729523	536788	451377	508343	552435	539299	739002	404186	598521	337376	628875	694474	701096	913718
FEB-2	521338	636530	524004	389529	362040	392347	343387	408564	449309	385413	427854	391658	409350	353396	455169	589154
FEB-3	526085	533419	453645	483254	342076	446240	355781	384944	300757	507172	471603	434167	510590	441083	526463	570251