	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
160	81	533709	14	80	483156	12	80	504820	12	07-JUN-07

Thr_Max in register units for M3R4-160

Thr_Max in register units for M3R4-160

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	82	78	87	89	78	86	73	83	77	80	70	88	80	84	78	80
FEB-2	69	86	84	78	79	86	75	82	76	82	76	84	78	82	77	90
FEB-3	83	79	80	82	76	79	77	77	86	70	81	81	88	76	83	80

Noise rate at Thr_Max [counts/sec] for M3R4-160

Noise rate at Thr_Max [counts/sec] for M3R4-160

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	500847	646743	465092	575244	458921	433400	341152	686540	492852	489691	445683	467541	445473	680899	727998	681267
FEB-2	466541	532161	515630	489065	344844	487491	612509	297759	308601	419567	405623	449620	515912	804887	514944	565339
FEB-3	752498	555664	554394	426921	425309	401995	374909	342549	367811	524706	471180	366711	512583	413930	649135	936832