	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
166	79	412528	12	78	457221	12	80	518279	12	08-JUN-07

Thr_Max in register units for M3R4-166

Thr_Max in register units for M3R4-166

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	80	83	81	73	85	79	81	73	80	75	84	75	80	85	73	75
FEB-2	81	70	77	75	84	70	86	79	86	75	77	78	78	79	78	77
FEB-3	83	82	83	77	90	74	84	79	87	73	80	77	81	72	82	71

Noise rate at Thr_Max [counts/sec] for M3R4-166

Noise rate at Thr_Max [counts/sec] for M3R4-166

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	552932	518357	454806	226346	388626	216635	515265	231457	362331	435347	468194	292659	345194	453388	722477	416436
FEB-2	511905	569613	450859	427521	522792	312256	585795	314456	359463	367965	421109	338958	421786	396251	744768	570032
FEB-3	499343	492783	540203	542132	753289	451713	449612	293086	453379	729183	491943	478701	444811	444803	538822	688657