	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
170	71	374762	11	75	422984	12	80	480686	13	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-170

Thr_Max in register units for M3R4-170

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	69	67	72	67	77	69	77	65	72	72	68	72	66	81	71	76
FEB-2	71	72	75	75	75	70	73	71	78	67	81	68	82	78	80	79
FEB-3	76	85	79	78	79	85	81	81	87	74	83	79	81	86	79	71

Noise rate at Thr_Max [counts/sec] for M3R4-170

Noise rate at Thr_Max [counts/sec] for M3R4-170

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	504186	424880	347045	686946	195207	262249	510029	274660	319253	297616	309456	199670	677968	225649	471039	290339
FEB-2	331468	626844	256810	487470	313304	707246	293752	552020	301108	503639	302395	417703	358066	369466	487298	459161
FEB-3	618647	478825	696864	385988	488635	292030	439048	305231	382942	332804	521407	336637	555495	442008	806844	607572