	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
172	80	432171	13	75	465885	12	77	467139	12	06-JUN-07

Thr_Max in register units for M3R4-172

Thr_Max in register units for M3R4-172

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	84	82	78	83	81	71	83	88	75	79	75	79	80	77	78	81
FEB-2	76	72	72	78	79	69	77	66	81	68	78	73	83	74	81	73
FEB-3	76	89	82	80	78	84	80	80	77	74	74	80	73	73	73	66

Noise rate at Thr_Max [counts/sec] for M3R4-172

Noise rate at Thr_Max [counts/sec] for M3R4-172

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	488294	570237	429473	336826	408889	481881	374170	361487	327348	353080	360764	278730	402195	479315	658104	603944
FEB-2	368954	653011	302049	762732	246087	518618	256255	462435	457749	420142	336598	410936	389054	575498	534033	760007
FEB-3	495272	532352	425293	449826	382457	575437	388351	332688	635549	342599	454036	305279	412778	485859	488301	768153