	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
174	78	476098	13	81	486835	12	81	420585	12	11-JUN-07

Thr_Max in register units for M3R4-174

Thr_Max in register units for M3R4-174

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	79	80	80	73	82	75	80	67	81	77	85	74	83	75	81	77
FEB-2	83	80	83	78	81	75	86	79	81	81	76	82	80	83	87	80
FEB-3	83	80	89	69	89	78	85	82	86	74	83	80	87	80	82	76

Noise rate at Thr_Max [counts/sec] for M3R4-174

Noise rate at Thr_Max [counts/sec] for M3R4-174

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	382558	568430	454677	560205	322614	459850	265490	391169	492642	362353	329425	345291	432872	932967	509542	807481
FEB-2	457036	576795	497138	622462	358505	328412	375224	643487	310028	515836	551413	321608	359371	643928	428479	799634
FEB-3	328579	414125	520054	361115	413203	380912	476016	288874	300287	332524	286191	377626	392212	739498	487997	630143