	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
175	74	368093	12	76	387900	11	77	432606	12	11-JUN-07

Thr_Max in register units for M3R4-175

Thr_Max in register units for M3R4-175

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	72	72	77	75	68	71	75	74	75	73	76	76	70	73	79	76
FEB-2	76	82	70	82	73	79	70	75	72	77	71	79	74	82	78	77
FEB-3	75	81	79	77	77	72	88	67	84	75	87	74	82	70	81	70

Noise rate at Thr_Max [counts/sec] for M3R4-175

Noise rate at Thr_Max [counts/sec] for M3R4-175

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	330372	612793	263921	404955	260472	355995	288743	303881	183411	341358	347729	472471	236482	364993	516079	605832
FEB-2	571857	581581	312539	426369	314730	362423	272976	352503	269319	335954	322346	261134	322738	495846	404085	599998
FEB-3	499472	596761	492384	368653	345992	388083	261748	381323	202128	459013	343229	455367	350282	636129	488223	652916