	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
180	74	472765	13	77	354507	11	78	457216	12	15-DEC-06		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-180

Thr_Max in register units for M3R4-180

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	78	73	68	69	83	63	77	70	76	75	72	75	77	75	83	68
FEB-2	73	83	81	70	81	75	78	69	78	78	79	76	74	83	72	78
FEB-3	74	76	72	73	87	78	76	74	87	75	81	77	86	77	79	72

Noise rate at Thr_Max [counts/sec] for M3R4-180

Noise rate at Thr_Max [counts/sec] for M3R4-180

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	426536	609805	397935	534149	297720	473458	351285	499221	465167	451223	309939	762743	377772	631262	507500	468527
FEB-2	303962	455494	382023	241617	316769	268824	314448	194042	341239	337118	306876	252773	498704	521574	462301	474352
FEB-3	385252	763504	327412	387528	238411	420241	365694	434798	555207	537528	481263	415628	398568	613962	536210	454248