	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
182	85	489149	13	80	421087	12	79	438795	13	18-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-182

Thr_Max in register units for M3R4-182

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	78	87	87	92	81	78	89	83	81	94	81	81	88	82	91	84
FEB-2	78	78	80	75	83	83	76	76	77	82	83	76	83	77	84	82
FEB-3	80	90	92	73	77	80	79	67	88	72	81	73	85	78	73	78

Noise rate at Thr_Max [counts/sec] for M3R4-182

Noise rate at Thr_Max [counts/sec] for M3R4-182

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	535100	662995	425521	515418	418322	430399	281893	403485	488548	450563	430351	404689	509305	515867	588568	765359
FEB-2	406125	481971	604121	381274	298205	325204	264711	480117	469962	279596	439772	314727	493922	381838	519863	595990
FEB-3	374824	509328	448296	332427	404774	378777	390611	424860	345697	345177	682665	339907	523346	434234	580973	504818