	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
183	82	609203	15	80	566509	14	79	540762	13	18-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-183

Thr_Max in register units for M3R4-183

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	79	80	71	91	77	85	75	85	84	91	73	92	85	81	73	84
FEB-2	73	81	76	83	79	76	84	79	79	79	85	83	83	78	83	74
FEB-3	80	76	75	78	80	79	79	79	82	81	76	83	78	82	80	76

Noise rate at Thr_Max [counts/sec] for M3R4-183

Noise rate at Thr_Max [counts/sec] for M3R4-183

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	570093	773366	770716	584944	511953	590346	383047	483846	594298	492705	482699	692610	573090	677985	663002	902540
FEB-2	530586	701032	455726	355435	370052	779990	695928	602353	475357	684510	598082	359182	645654	576591	711619	522046
FEB-3	587622	686486	445070	585720	426354	792834	378495	434707	578040	664826	358507	419282	481932	529934	607776	674599