	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
184	79	372908	11	80	386797	12	84	325830	11	06-JUL-07

Thr_Max in register units for M3R4-184

Thr_Max in register units for M3R4-184

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	82	80	80	87	75	79	77	75	79	77	73	79	83	81	83	76
FEB-2	85	81	71	77	82	82	81	79	88	75	82	75	84	83	77	79
FEB-3	82	85	82	91	83	81	84	85	83	89	85	88	84	82	80	82

Noise rate at Thr_Max [counts/sec] for M3R4-184

Noise rate at Thr_Max [counts/sec] for M3R4-184

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	284219	553140	351408	398819	261662	558594	298916	395132	188626	601438	438455	265541	200098	439727	277217	453530
FEB-2	480922	375022	500567	374561	331218	332791	407362	279734	371811	233472	370289	271396	354949	412099	499904	592660
FEB-3	260568	567341	342831	319081	190739	452817	238172	285856	259826	294175	208707	365169	189969	439827	382874	415327