	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
185	75	575488	16	82	571215	13	78	449912	13	18-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-185

Thr_Max in register units for M3R4-185

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	78	76	78	71	76	76	80	78	71	69	71	72	76	81	74	78
FEB-2	88	91	78	83	77	77	83	83	88	75	90	80	83	78	80	84
FEB-3	77	87	74	79	71	82	69	80	78	79	79	73	79	81	71	87

Noise rate at Thr_Max [counts/sec] for M3R4-185

Noise rate at Thr_Max [counts/sec] for M3R4-185

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	892049	723355	589936	423846	588992	414901	682325	413886	569853	438612	642219	397993	564414	457398	862426	545603
FEB-2	657649	624741	507142	768771	419883	619129	658538	531305	326459	483041	389757	708670	486197	672295	555479	730380
FEB-3	431381	523958	468683	509481	420251	346077	323725	377888	402110	268887	544718	549369	563929	454448	526192	487494