	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
186	84	318627	11	83	440520	12	80	523255	14	18-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-186

Thr_Max in register units for M3R4-186

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	85	80	75	92	77	87	85	86	89	88	88	89	88	88	76	78
FEB-2	78	85	84	88	83	87	84	85	81	87	76	85	78	87	78	83
FEB-3	80	79	79	88	80	76	80	84	80	80	80	85	78	77	81	80

Noise rate at Thr_Max [counts/sec] for M3R4-186

Noise rate at Thr_Max [counts/sec] for M3R4-186

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	323995	384837	322401	391067	256908	301578	286535	241390	239444	213195	234331	232006	261010	217220	442751	749358
FEB-2	457673	593225	303572	383177	379142	459650	348273	589850	484068	411027	361122	465399	378998	500572	498576	433993
FEB-3	402470	619873	474239	646081	513586	615602	355011	600364	440216	481280	348419	498324	498204	582453	547072	748886