	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
188	80	549565	13	77	409234	12	76	543297	13	18-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-188

Thr_Max in register units for M3R4-188

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	82	79	84	66	88	79	91	80	90	75	78	72	89	73	86	70
FEB-2	78	84	82	87	74	83	71	86	70	79	72	73	74	78	68	74
FEB-3	82	72	74	78	70	75	72	69	76	81	73	74	78	80	76	78

Noise rate at Thr_Max [counts/sec] for M3R4-188

Noise rate at Thr_Max [counts/sec] for M3R4-188

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	637664	625887	946513	405418	392900	500282	559401	351403	458069	652004	569293	396213	441092	453864	579862	823182
FEB-2	258686	475221	378124	616566	304036	386036	304058	350928	419975	494618	517152	287886	407069	372530	571509	403348
FEB-3	527804	654700	518727	668538	423463	535511	476871	453469	526000	681083	591254	423862	573940	430381	659919	547226