	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
189	76	505578	14	80	463717	12	76	443303	12	19-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-189

Thr_Max in register units for M3R4-189

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	75	80	69	88	82	81	77	78	72	74	72	75	72	75	74	78
FEB-2	74	83	74	90	81	83	75	78	82	79	84	78	75	82	89	79
FEB-3	73	78	77	67	82	76	75	77	81	75	71	80	75	75	71	78

Noise rate at Thr_Max [counts/sec] for M3R4-189

Noise rate at Thr_Max [counts/sec] for M3R4-189

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	522261	704808	432169	469866	397313	459629	451110	466667	497222	524085	546688	386924	502117	616703	606354	505339
FEB-2	453777	528749	419814	444673	339001	477329	424145	393958	317963	391844	570938	403147	462932	604670	582838	603700
FEB-3	594877	543356	365644	439704	370664	364703	370614	454404	513674	345823	404073	395539	486608	503112	603719	336332