	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
192	74	491660	14	78	413606	12	82	483247	13	19-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-192

Thr_Max in register units for M3R4-192

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	78	72	77	76	72	77	62	78	68	74	70	83	72	78	76	72
FEB-2	75	86	69	88	74	86	77	73	69	83	79	80	76	81	80	74
FEB-3	86	75	81	81	83	80	81	79	85	79	83	82	86	77	97	79

Noise rate at Thr_Max [counts/sec] for M3R4-192

Noise rate at Thr_Max [counts/sec] for M3R4-192

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	526829	568182	598875	404755	722177	459416	431565	386031	380866	340969	363422	482756	689781	431975	617192	461767
FEB-2	431113	601301	437826	406406	256359	420653	401548	360547	333798	382295	245668	630596	306363	452719	503285	447213
FEB-3	493370	554805	427301	444906	496554	396729	418834	419249	403986	611962	395578	532095	397106	474806	483934	780730