	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
193	74	473974	13	74	560160	14	76	496320	13	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-193

Thr_Max in register units for M3R4-193

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	73	84	76	80	79	72	77	79	78	73	66	68	71	71	75	64
FEB-2	73	79	76	81	68	72	70	80	76	75	71	73	70	73	63	80
FEB-3	76	70	83	71	77	70	77	73	73	73	76	76	70	84	80	82

Noise rate at Thr_Max [counts/sec] for M3R4-193

Noise rate at Thr_Max [counts/sec] for M3R4-193

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	428535	490760	437094	454971	413118	371432	798776	520579	323487	313401	518626	395483	441255	537257	573956	564860
FEB-2	474381	675747	396270	560757	416011	564247	509800	483147	395748	520553	404872	546392	541485	884433	782526	806188
FEB-3	537915	599851	606660	470802	445562	479439	244776	434614	283447	401302	443372	636765	468181	533668	684485	670275