	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
194	84	628674	15	78	659205	14	83	505449	12	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-194

Thr_Max in register units for M3R4-194

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	83	84	81	81	93	86	91	82	80	77	81	82	87	84	86	80
FEB-2	71	83	84	77	81	88	73	84	76	74	78	77	77	70	76	78
FEB-3	74	82	75	86	83	90	80	84	83	82	81	85	83	83	84	85

Noise rate at Thr_Max [counts/sec] for M3R4-194

Noise rate at Thr_Max [counts/sec] for M3R4-194

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	557605	677807	494750	497409	723422	578413	627090	707657	605390	751155	504772	570336	584342	575664	767633	835338
FEB-2	501165	741428	519826	572579	549192	523792	564659	553992	486528	454061	529606	502585	1254263	1189145	852381	752081
FEB-3	375897	578841	442495	649476	464542	580570	428887	716801	269622	364472	448775	592923	382480	591600	534002	665802